Growth and characterization of ultrathin carbon films on electrodeposited Cu and Ni-Reference-Cited by-同舟云学术

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Growth and characterization of ultrathin carbon films on electrodeposited Cu and Ni

Published:2017-08-01 Issue:11 Volume:49 Page:1088-1094
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf Interface Anal

Author:

Pedrazzetti L.¹,Nobili L.¹,Magagnin L.¹,Bernasconi R.¹,Lucotti A.¹,Soltani P.²,Mezzi A.²,Kaciulis S.²^ORCID

Affiliation:

1. Dip.to di Chimica, Materiali ed Ing. Chimica “Giulio Natta”; Politecnico di Milano; Milan Italy

2. Institute for the Study of Nanostructured Materials, ISMN-CNR; Rome Italy

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference34 articles.

1. Graphene and carbon nanotube (CNT) in MEMS/NEMS applications

2. Review of Chemical Vapor Deposition of Graphene and Related Applications

3. Evolution of Graphene Growth on Ni and Cu by Carbon Isotope Labeling

4. Effect of Substrate Roughness and Feedstock Concentration on Growth of Wafer-Scale Graphene at Atmospheric Pressure

5. Chemical Vapor Deposition of Graphene Single Crystals

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1. In-depth photocarrier dynamics in a barrier variable iron-oxide and vertically aligned reduced-graphene oxide composite;npj 2D Materials and Applications;2022-09-03

2. Graphene Growth on Electroformed Copper Substrates by Atmospheric Pressure CVD;Materials;2022-02-19

3. From single-layer graphene to HOPG: Universal functionalization strategy with perfluoropolyether for the graphene family materials;Diamond and Related Materials;2022-02

4. Transient absorption spectroscopy as a promising optical tool for the quality evaluation of graphene layers deposited by microwave plasma;Surface and Coatings Technology;2020-08

5. Non-destructive depth profile reconstruction of single-layer graphene using angle-resolved X-ray photoelectron spectroscopy;Applied Surface Science;2019-10

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