1. Research, Development and Implementation of Methods for Determining Surface Density and Mass Fraction of Elements for Multilayer and Multicomponent Coatings by X-Ray Fluorescence Method;Measurement Standards. Reference Materials;2024-07-10
2. X-ray fluorescence analysis of solid-state films, layers, and coatings;Radiation Physics and Chemistry;2022-08
3. Angular Distributions during Magnetron Sputtering of Polycrystalline Mg, Al, Si, Ti, Cr, Cu, Zn, Ge, Zr, Nb, Mo, Ag, In, Sn, W, Pt, Au, and Bi Targets;Instruments and Experimental Techniques;2020-09-23
4. Bench-scale insight into the amenability of case barren copper ores towards XRF-based bulk sorting;Minerals Engineering;2018-06
5. Study of epitaxial selective area growth In1−xGaxAs films by synchrotron μ-XRF mapping;Journal of Analytical Atomic Spectrometry;2010