Combined In Situ XRD and Ex Situ TEM Studies of Thin Ba 0.5 Sr 0.5 TiO 3 Films Grown by PLD on MgO-Reference-Cited by-同舟云学术

Combined In Situ XRD and Ex Situ TEM Studies of Thin Ba 0.5 Sr 0.5 TiO 3 Films Grown by PLD on MgO

Published:2020-07-20 Issue:9 Volume:55 Page:1900235
ISSN:0232-1300
Container-title:Crystal Research and Technology
language:en
Short-container-title:Crystal Research and Technology

Author:

Bauer Sondes¹^ORCID,Rodrigues Adriana¹,Jin Xiaowei²,Schneider Reinhard²,Müller Erich²,Gerthsen Dagmar²,Baumbach Tilo¹³

Affiliation:

1. Institute for Photon Science and Synchrotron Radiation Karlsruhe Institute of Technology Hermann‐von‐Helmholtz‐Platz 1 Eggenstein‐Leopoldshafen D‐76344 Germany

2. Laboratory for Electron Microscopy Karlsruhe Institute of Technology Engesserstraße 7 Karlsruhe D‐76131 Germany

3. Laboratory for Application of Synchrotron Radiation Karlsruhe Institute of Technology Kaiserstraße 12 Karlsruhe D‐76131 Germany

Funder

Deutsche Forschungsgemeinschaft

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/crat.201900235

Reference17 articles.

1. Microwave dielectric properties of strained Ba0.5Sr0.5TiO3 films with and without strain-induced permanent polarization at room temperature

2. Ferroelectric and paraelectric Ba0.5Sr0.5TiO3 film structure distortions at room temperature and their effects on tunable microwave properties

3. Influence of oxygen pressure on the structural and dielectric properties of laser-ablated Ba0.5Sr0.5TiO3thin films epitaxially grown on (001) MgO for microwave phase shifters

4. Microwave dielectric properties of strained (Ba0.4Sr0.6)TiO3 thin films

5. Phase diagrams and dielectric response of epitaxial barium strontium titanate films: A theoretical analysis

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