Simulation of electron-excited X-ray spectra with NIST-NIH Desktop Spectrum Analyzer (DTSA)

Author:

Newbury Dale E.,Myklebust Robert L.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference19 articles.

1. , , , , , , . Scanning Electron Microscopy and X-ray Microanalysis (3rd edn). Kluwer Academic Plenum: New York, 2003; 390.

2. . Transmission Electron Microscopy. Plenum: New York, 1996; 587.

3. , . Desktop Spectrum Analyzer (DTSA), a Comprehensive Software Engine for Electron-excited X-ray Spectrometry. National Institute of Standards and Technology: Gaithersburg, MD, 1991; Standard Reference Data Program; available from the following WorldWideWeb site: http://www.cstl.nist.gov/div837/Division/outputs/software.htm.

4. Electron Beam X-ray Microanalysis. Van Nostrand-Reinhold: New York, 1981; 255.

5. Zur Theorie des Durchgangs schneller Korpuskularstrahlen durch Materie

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