Detection of Subsurface, Nanometer‐Scale Crystallographic Defects by Nonlinear Light Scattering and Localization-Reference-Cited by-同舟云学术

Detection of Subsurface, Nanometer‐Scale Crystallographic Defects by Nonlinear Light Scattering and Localization

Published:2021-06-06 Issue:16 Volume:9 Page:2002252
ISSN:2195-1071
Container-title:Advanced Optical Materials
language:en
Short-container-title:Advanced Optical Materials

Author:

Shafiei Farbod¹^ORCID,Orzali Tommaso²,Vert Alexey²³,Miri Mohammad‐Ali⁴⁵,Hung Pui Yee²,Wong Man Hoi²,Alù Andrea⁴⁶⁷,Bersuker Gennadi⁸,Downer Michael C.¹

Affiliation:

1. Department of Physics The University of Texas at Austin Austin TX 78712 USA

2. SEMATECH Albany NY 12203 USA

3. Sunny Polytechnic Institute Albany NY 12203 USA

4. Department of Electrical and Computer Engineering The University of Texas at Austin Austin TX 78712 USA

5. Department of Physics Queens College of the CUNY Queens NY 11367 USA

6. Photonics Initiative Advanced Science Research Center CUNY New York NY 10031 USA

7. Physics Program Graduate Center CUNY New York NY 10016 USA

8. The Aerospace Corporation Los Angeles CA 90245 USA

Funder

Welch Foundation

National Science Foundation

Publisher

Wiley

Subject

Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/adom.202002252

Reference39 articles.

1. Nanometre-scale electronics with III–V compound semiconductors

2. Quantum Spintronics: Engineering and Manipulating Atom-Like Spins in Semiconductors

3. A III–V nanowire channel on silicon for high-performance vertical transistors

4. It’s Time to Reinvent the Transistor!

5. Ultrasonic force microscopy for nanometer resolution subsurface imaging

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Evaluation of the surface and subsurface evolution of single-crystal yttrium aluminum garnet during polishing;Applied Surface Science;2023-01

2. Collection of propagating electromagnetic fields by uncoated probe;Ultramicroscopy;2022-10