Rectification in Ionic Field Effect Transistors Based on Single Crystal Silicon Nanopore

Author:

Hong Hao12ORCID,Lei Xin3,Wei Jiangtao2,Zhang Yang4,Zhang Yulong2,Sun Jianwen2,Zhang Guoqi1,Sarro Pasqualina M.1,Liu Zewen2ORCID

Affiliation:

1. Department of Microelectronics Delft University of Technology Delft 2628 CD The Netherlands

2. School of Integrated Circuits Tsinghua University Beijing 100084 China

3. School of Chemistry Beihang University Beijing 100084 China

4. School of Electronic and Information Engineering Beijing Jiaotong University Beijing 100084 China

Abstract

AbstractIonic FETs have enormous potential for energy conversion, sensing, and ionic circuits due to their efficient regulation of the nanochannel. Here ionic FETs based on single‐crystal silicon nanopores and the rectification of the fabricated devices are studied. The electrical characterization results demonstrated that since the silicon‐based nanopores have the advantage of modulating the surface charge due to their semiconductor nature and benefitting from the effective 3D gating effect on the nanochannel, the magnitude and polarity of surface charge can be modulated by the gate voltage. The rectification effect can be adjusted by applying a certain voltage and fulfilling a transition between anion selectivity and cation selectivity when the surface charge polarity is reversed. Moreover, current–voltage characteristics of the reported ionic FET can be switched between ohmic and diode‐like regimes. The proposed ionic FETs supply a novel platform to study the ionic properties and have great potential to be applied in large‐scale ionic circuits due to their excellent performance. Finally, simulation results prove the surface charge modulated by the gate voltage determines the magnitude and direction of rectification, which is consistent with the reported experiment result.

Funder

National Key Research and Development Program of China

Publisher

Wiley

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