Life Prediction of Residual Current Device Based on Wiener Process with GM (1, 1) Model

Author:

Liu Guojin1,Wang Ze1,Li Xiang1,Yue Chenghao1,Li Wenhua1

Affiliation:

1. State Key Laboratory of Reliability and Intelligence of Electrical Equipment Hebei University of Technology No.8, GuangRong Street, HongQiao District, Tianjin China

Funder

Natural Science Foundation of Hebei Province

Publisher

Wiley

Subject

Electrical and Electronic Engineering

Reference16 articles.

1. Analysis of performance degradation and residual life prediction of batteries for electric vehicles under driving conditions

2. Reliability Estimation from Linear Degradation and Failure Time Data With Competing Risks Under a Step-Stress Accelerated Degradation Test

3. Study on lifetime prediction considering fatigue accumulative effect for die-attach solder layer in an IGBT module

4. Remaining life prediction of AC contactors based on statistical regression and nonlinear wiener process;Kui L;Transactions of China Electrotechnical Society,2019

5. Gamma degradation process and accelerated model combined reliability analysis method for rubber O‐rings;Bo S;IEEE Access,2018

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