29‐4: TOF SIMS for OLED Film 3D Detection and Real‐Time Failure Analysis-Reference-Cited by-同舟云学术

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29‐4: TOF SIMS for OLED Film 3D Detection and Real‐Time Failure Analysis

Published:2024-06 Issue:1 Volume:55 Page:377-381
ISSN:0097-966X
Container-title:SID Symposium Digest of Technical Papers
language:en
Short-container-title:Symp Digest of Tech Papers

Author:

Zheng Kening¹,Fu Qiang²,Shi Bo¹,Chen Long¹,Gao Dongyu³,Zhu Li¹,Li Langtao¹,Wang Dengyu¹,Pan Xuenan¹,Zhang Kai¹,Yang Dongfang¹,Tang Guoqiang¹,Jin Fujiang¹

Affiliation:

1. Chengdu BOE Optoelectroncs Technology Co., Ltd. Chengdu China

2. BOE Technology Group Co., Ltd. Beijing China

3. Chongqing BOE Display Technology Co., Ltd. China

Abstract

By analyzing OLED film layers using the TOF SIMS method with 3D imaging capability, we can effectively improve the detection of OLED defects and understand the constitutive relationship. This inspection method can be integrated into the production line to realize process improvement and defect interception during mass production.

Publisher

Wiley

Reference7 articles.

1. The Effect of Doping Distribution on the Property of Green Phosphorescent Organic Light-Emitting Diodes;Liu Bin;ICDT,2023

2. Analysis and Design of a High-Frequency Isolated Dual-Transformer DC-DC Resonant Converter

3. Breaking the Efficiency Limit of Deep-Blue Fluorescent OLEDs Based on Anthracene Derivatives;Lim Houngcheol.;Adv. Mater,2022

4. Foldable AMOLED Display Utilizing Novel COE Structure;Chuan X. Xu;SID DIGEST,2018

5. The Role of Dopant Materials on Current Efficiency Roll-off in Organic Light-Emitting Diode;Liu Bin;International Conference on Display Technology,2022

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