Design of a Full-Profile-Matching Solution for High-Throughput Analysis of Multiphase Samples Through Powder X-ray Diffraction-Reference-Cited by-同舟云学术

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Design of a Full-Profile-Matching Solution for High-Throughput Analysis of Multiphase Samples Through Powder X-ray Diffraction

Published:2009-04-20 Issue:17 Volume:15 Page:4258-4269
ISSN:0947-6539
Container-title:Chemistry - A European Journal
language:en
Short-container-title:Chem. Eur. J.

Author:

Baumes Laurent A.,Moliner Manuel,Corma Avelino

Publisher

Wiley

Subject

General Chemistry,Catalysis,Organic Chemistry

Reference77 articles.

1. Data management and visualization of x-ray diffraction spectra from thin film ternary composition spreads

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