Diamond as Advanced Material for Scanning Probe Microscopy Tips-Reference-Cited by-同舟云学术

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Diamond as Advanced Material for Scanning Probe Microscopy Tips

Published:2015-10-27 Issue:1 Volume:28 Page:35-45
ISSN:1040-0397
Container-title:Electroanalysis
language:en
Short-container-title:Electroanalysis

Author:

Kranz Christine

Funder

Focused Ion Beam Center UUlm

FEI Company

German Science Foundation

Struktur- und Innovationsfonds Baden-Württemberg

Baden-Württemberg Stiftung

Publisher

Wiley

Subject

Electrochemistry,Analytical Chemistry

Reference109 articles.

1. Cover Picture: (Electroanalysis 1/2015)

2. Electroanalysis at Diamond-Like and Doped-Diamond Electrodes

3. Advanced Carbon Electrode Materials for Molecular Electrochemistry

4. Electrochemistry of Carbon Electrodes

5. Carbon Paste Electrodes

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Preparation and characterization of conductive diamond for a scanning tunneling microscope tip;Diamond and Related Materials;2022-12

2. Intercrystallite boundaries dominate the electrochemical corrosion behavior of polycrystalline diamond;Carbon;2022-11

3. Focused ion beam-based microfabrication of boron-doped diamond single-crystal tip cantilevers for electrical and mechanical scanning probe microscopy;Measurement;2022-01

4. Intercrystallite Boundaries Dominate the Electrochemical Corrosion Behavior of Polycrystalline Diamond;SSRN Electronic Journal;2022

5. UV-to-IR highly transparent ultrathin diamond nanofilms with intriguing performances: Anti-fogging, self-cleaning and self-lubricating;Applied Surface Science;2020-10

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