Micro‐morphological investigations on wettability of Al‐incorporated c ‐Si thin films using statistical surface roughness parameters-Reference-Cited by-同舟云学术

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Micro‐morphological investigations on wettability of Al‐incorporated c ‐Si thin films using statistical surface roughness parameters

Published:2021-11-15 Issue:2 Volume:54 Page:174-186
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surface & Interface Analysis

Author:

Maity Gurupada¹,Yadav Ram Pratap²,Ojha Sunil³,Singhal Rahul⁴,Kanjilal Dinakar³,Patel Shiv Poojan¹^ORCID

Affiliation:

1. Department of Pure and Applied Physics Guru Ghasidas Vishwavidyalaya (A Central University) Bilaspur India

2. Department of Physics Deen Dayal Upadhyay Govt. PG College Allahabad India

3. Inter University Accelerator Centre New Delhi India

4. Department of Physics Malaviya National Institute of Technology Jaipur India

Funder

Inter-University Accelerator Centre

University Grants Commission of Bangladesh

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/sia.7036

Reference50 articles.

1. On the structural-optical properties of Al-containing amorphous Si thin films and the metal-induced crystallization phenomenon

2. Aluminum-induced crystallization for thin-film polycrystalline silicon solar cells: Achievements and perspective

3. A novel route to a polycrystalline silicon thin-film solar cell

4. Polycrystalline silicon thin-film solar cells on glass by aluminium-induced crystallisation and subsequent ion-assisted deposition (ALICIA)

5. 8% Efficient thin-film polycrystalline-silicon solar cells based on aluminum- induced crystallization and thermal CVD

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