Far- and Deep-UV Spectroscopy of Semiconductor Nanoparticles Measured Based on Attenuated Total Reflectance spectroscopy-Reference-Cited by-同舟云学术

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Far- and Deep-UV Spectroscopy of Semiconductor Nanoparticles Measured Based on Attenuated Total Reflectance spectroscopy

Published:2016-02 Issue:4 Volume:17 Page:516-519
ISSN:1439-4235
Container-title:ChemPhysChem
language:en
Short-container-title:ChemPhysChem

Author:

Tanabe Ichiro¹,Yamada Yosuke¹,Ozaki Yukihiro¹

Affiliation:

1. Department of Chemistry; Kwansei Gakuin University; Gakuen 2-1, Sanda Hyogo 669-1337 Japan

Funder

Kurata Memorial Hitachi Science and Technology Foundation

Iketani Science and Technology Foundation

Publisher

Wiley

Subject

Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/cphc.201500992/fullpdf

Reference36 articles.

1. Photocatalysis on TiO2 Surfaces: Principles, Mechanisms, and Selected Results

2. Titanium Dioxide Nanomaterials: Synthesis, Properties, Modifications, and Applications

3. A comprehensive review of ZnO materials and devices

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