Polarity analysis of GaN nanorods by photo-assisted Kelvin probe force microscopy-Reference-Cited by-同舟云学术

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Polarity analysis of GaN nanorods by photo-assisted Kelvin probe force microscopy

Published:2011-05-09 Issue:7-8 Volume:8 Page:2157-2159
ISSN:1862-6351
Container-title:physica status solidi (c)
language:en
Short-container-title:Phys. Status Solidi C

Author:

Wei Jiandong,Neumann Richard,Wang Xue,Li Shunfeng,Fündling Sönke,Merzsch Stephan,Al-Suleiman Mohamed A. M.,Sökmen Ünsal,Wehmann Hergo-H.,Waag Andreas

Publisher

Wiley

Subject

Condensed Matter Physics

Cited by 22 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The van der Waals Epitaxy of High‐Quality N‐Polar Gallium Nitride for High‐Response Ultraviolet Photodetectors with Polarization Electric Field Modulation;Advanced Electronic Materials;2021-10-20

2. Controlling the Electron Concentration for Surface-Enhanced Raman Spectroscopy;ACS Photonics;2021-07-27

3. Polarity control and fabrication of lateral polarity structures of III-nitride thin films and devices: progress and prospects;Journal of Physics D: Applied Physics;2020-09-21

4. Characterization of carrier transport behavior of specific type dislocations in GaN by light assisted KPFM;Journal of Physics D: Applied Physics;2020-04-03

5. Lateral-Polarity Structure of AlGaN Quantum Wells: A Promising Approach to Enhancing the Ultraviolet Luminescence;Advanced Functional Materials;2018-06-08

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