Die Bestimmung der Austrittstiefe von Photoelektronen in Caesium–Antimon-Schichten-Reference-Cited by-同舟云学术

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Die Bestimmung der Austrittstiefe von Photoelektronen in Caesium–Antimon-Schichten

Published:1968 Issue:2 Volume:26 Page:527-535
ISSN:0370-1972
Container-title:Physica Status Solidi (b)
language:de
Short-container-title:Phys. Stat. Sol. (b)

Author:

Hirschberg K.,Deutscher K.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. Dbp 910 570;

2. Interferenz-Photokathoden erh�hter Ausbeute mit frei w�hlbarem spektralem Maximum

3. Interferenz-Photokathoden erh�hter Ausbeute mit frei w�hlbarem spektralem Maximum

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1. A Survey of Recent Advances in the Theory and Practice of Vacuum Photoemitters;Advances in Electronics and Electron Physics;1985

2. Surface energy transfer enhanced by optical cavity excitation: a pole analysis;Journal of the Optical Society of America;1982-02-01

3. Surface-plasmon-assisted photoemission;Journal of the Optical Society of America;1981-10-01

4. VI Photoemission;Progress in Optics;1977

5. Surface and volume photoemission in thin films;Thin Solid Films;1976-07

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