Determination of the depth resolution of Auger electron spectroscopy depth profiles of anodic barrier oxide films on differently pretreated aluminium substrates-Reference-Cited by-同舟云学术

Determination of the depth resolution of Auger electron spectroscopy depth profiles of anodic barrier oxide films on differently pretreated aluminium substrates

Published:1994-07 Issue:1-12 Volume:22 Page:175-180
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

De Laet J.,De Boeck K.,Terryn H.,Vereecken J.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference18 articles.

1. and Proc. of the Annual Technical Conference and Exhibition, p. 113. IMF, Stratford upon Avon, UK (1988).

2. AC electrograining of aluminium

3. and Proc. XIth International Congress on Electron Microscopy, p. 1069. Kyoto, Japan (1986).

4. and Treatise on Materials Science and Technology, Vol. 23, Chap. 5. Academic Press, London (1983).

5. The Direct Observation of Barrier Layers in Porous Anodic Oxide Films

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