Memristive Devices for Quantum Metrology-Reference-Cited by-同舟云学术

Memristive Devices for Quantum Metrology

Published:2020-04-13 Issue:5 Volume:3 Page:2000009
ISSN:2511-9044
Container-title:Advanced Quantum Technologies
language:en
Short-container-title:Adv Quantum Tech

Author:

Milano Gianluca¹²^ORCID,Ferrarese Lupi Federico¹,Fretto Matteo¹,Ricciardi Carlo²,De Leo Natascia¹,Boarino Luca¹

Affiliation:

1. Advanced Materials Metrology and Life Science DivisionINRiM (Istituto Nazionale di Ricerca Metrologica) Strada delle Cacce 91 Torino 10135 Italy

2. Department of Applied Science and TechnologyPolitecnico di Torino C.so Duca degli Abruzzi 24 Torino 10129 Italy

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Computational Theory and Mathematics,Condensed Matter Physics,Mathematical Physics,Nuclear and High Energy Physics,Electronic, Optical and Magnetic Materials,Statistical and Nonlinear Physics

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/qute.202000009

Reference74 articles.

1. The new system of units

2. The New International System of Units (SI)

3. Metrology in electricity and magnetism: EURAMET activities today and tomorrow

4. BIPM Bureau International des Poids et Mesures The International System of Units (SI Brochure) [9th Edition] 2019.

5. The ampere and the electrical units in the quantum era

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