Spectroscopic ellipsometric study of Ge nanocrystals embedded in SiO2 using parametric models
Author:
Publisher
Wiley
Subject
Condensed Matter Physics
Reference18 articles.
1. Semiconductor nanocrystals in dielectrics: Optoelectronic and memory applications of related silicon-based MIS devices
2. Electronic properties of Ge nanocrystals for non volatile memory applications
3. Electrical and memory properties of silicon nitride structures with embedded Si nanocrystals
4. Growth of two-dimensional arrays of silicon nanocrystals in thin SiO2layers by low pressure chemical vapour deposition and high temperature annealing/oxidation. Investigation of their charging properties
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Microstructure and dielectric functions of Ge nanocrystals embedded between amorphous Al2O3films: study of confinement and disorder;Journal of Experimental Nanoscience;2012-07-04
2. Near-infrared–ultraviolet absorption cross sections for Ge nanocrystals in SiO2 thin films: Effects of shape and layer structure;Journal of Applied Physics;2011-05
3. Bandgap expansion and dielectric suppression of self-assembled Ge nanocrystals;Journal of Applied Physics;2011-03-15
4. Optical, electrical and structural properties of SiO : H films prepared from He dilution to the SiH4plasma;Journal of Physics D: Applied Physics;2009-10-14
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