Electrical and optical characterization of n‐type ZnO thin films
Author:
Affiliation:
1. Department of Electrical and Electronic Engineering, Miyazaki University, 1‐1 Gakuen kibanadai‐nishi, Miyazaki 889‐2192, Japan
2. Department of Applied Physics, Okayama University of Science, 1‐1Ridai‐cho, Okayama 700‐0005, Japan
Publisher
Wiley
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssc.200306187
Reference7 articles.
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4. Growth and characterization of Ga-doped ZnO layers on a-plane sapphire substrates grown by molecular beam epitaxy
5. JCPDS No. 36145.
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