Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies-Reference-Cited by-同舟云学术

Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies

Published:2008-05 Issue:5 Volume:5 Page:1399-1402
ISSN:1610-1634
Container-title:physica status solidi (c)
language:en
Short-container-title:phys. stat. sol. (c)

Author:

Ohlídal Ivan,Necas David,Franta Daniel

Publisher

Wiley

Subject

Condensed Matter Physics

Reference15 articles.

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5. Influence of overlayers on determination of the optical constants of ZnSe thin films

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