Degradation in AlGaInN lasers

Author:

Takeya Motonobu,Mizuno Takashi1,Sasaki Tomomi1,Ikeda Shinro1,Fujimoto Tsuyoshi1,Ohfuji Yoshio1,Oikawa Kenji1,Yabuki Yoshifumi1,Uchida Shiro1,Ikeda Masao1

Affiliation:

1. Development Center, Sony Shiroishi Semiconductor Inc., 3‐53‐2 Shiratori, Shiroishi‐shi, Miyagi‐ken, 989‐0734 Japan

Publisher

Wiley

Cited by 40 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. GaN based ultraviolet laser diodes;Journal of Semiconductors;2024-01-01

2. Defects and Reliability of GaN‐Based LEDs: Review and Perspectives;physica status solidi (a);2022-02-24

3. Physics and Technology of AlGaInN‐Based Laser Diode;digital Encyclopedia of Applied Physics;2021-06-28

4. New mechanisms of cavity facet degradation for GaN-based laser diodes;Journal of Applied Physics;2021-06-14

5. Degradation mechanisms of InGaN visible LEDs and AlGaN UV LEDs;Reliability of Semiconductor Lasers and Optoelectronic Devices;2021

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