Optical phase diagram of amorphous carbon films determined by spectroscopic ellipsometry-Reference-Cited by-同舟云学术

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Optical phase diagram of amorphous carbon films determined by spectroscopic ellipsometry

Published:2008-05 Issue:5 Volume:5 Page:1223-1226
ISSN:1610-1634
Container-title:physica status solidi (c)
language:en
Short-container-title:phys. stat. sol. (c)

Author:

Budai J.,Toth Z.

Publisher

Wiley

Subject

Condensed Matter Physics

Reference23 articles.

1. Diamond-like amorphous carbon

2. Raman spectroscopy of hydrogenated amorphous carbons

3. Reactive pulsed laser deposition of hydrogenated carbon thin films: The effect of hydrogen pressure

4. Electronic structure studies of undoped and nitrogen-doped tetrahedral amorphous carbon using high-resolution electron energy-loss spectroscopy

5. Structural characterization of diamond-like carbon films for ultracold neutron applications

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Structural analysis of amorphous carbon films by spectroscopic ellipsometry, RBS/ERDA, and NEXAFS;Applied Physics Letters;2017-05-15

2. Ellipsometric study of nanostructured carbon films deposited by pulsed laser deposition;Thin Solid Films;2011-02

3. Detection and characterization of carbon contamination on EUV multilayer mirrors;Optics Express;2009-09-09

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