Controlled Doping of Wafer‐Scale PtSe 2 Films for Device Application-Reference-Cited by-同舟云学术

Controlled Doping of Wafer‐Scale PtSe 2 Films for Device Application

Published:2018-12-06 Issue:4 Volume:29 Page:1805614
ISSN:1616-301X
Container-title:Advanced Functional Materials
language:en
Short-container-title:Adv. Funct. Mater.

Author:

Xu Hu¹,Zhang Haima¹,Liu Yawen²,Zhang Simeng¹,Sun Yangye³,Guo Zhongxun¹,Sheng Yaochen¹,Wang Xudong⁴,Luo Chen⁵,Wu Xing⁵,Wang Jianlu⁴,Hu Weida⁴,Xu Zihan⁶,Sun Qingqing¹,Zhou Peng¹,Shi Jing²,Sun Zhengzong³,Zhang David Wei¹,Bao Wenzhong¹^ORCID

Affiliation:

1. State Key Laboratory of ASIC and System School of Microelectronics Fudan University Shanghai 200433 China

2. Department of Physics and Astronomy University of California Riverside CA 92521 USA

3. Department of Chemistry Fudan University Shanghai 200433 China

4. State Key Laboratory of Infrared Physics Shanghai Institute of Technical Physics Chinese Academy of science 500 Yutian Road Shanghai 200083 China

5. Shanghai Key Laboratory of Multidimensional Information Processing Department of Electronic Engineering East China Normal University 500 Dongchuan Road Shanghai 200241 China

6. Shenzhen Sixcarbon Technology Shenzhen 518106 China

Funder

Science and Technology Commission of Shanghai Municipality

National Natural Science Foundation of China

Chinese Academy of Sciences

National Science Foundation

Publisher

Wiley

Subject

Electrochemistry,Condensed Matter Physics,Biomaterials,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/adfm.201805614