Affiliation:
1. Department of Materials Science and Engineering City University of Hong Kong Kowloon Hong Kong SAR 999077 China
2. State Key Laboratory of Terahertz and Millimeter Waves City University of Hong Kong Kowloon Hong Kong SAR 999077 China
3. Key Laboratory of Advanced Materials Processing & Mold (Zhengzhou University) Ministry of Education Zhengzhou 450002 China
4. Institute for Materials Chemistry and Engineering Kyushu University Fukuoka 816–8580 Japan
Abstract
AbstractThe operation stability of halide perovskite devices is the critical issue that impedes their commercialization. The main reasons are that the ambient H2O molecules can easily deteriorate the perovskites, while the metal electrodes react in different degrees with the perovskites. Herein, one kind of new electrode, the metalloids, is reported, which are much more stable than the conventional noble metals as electrical contacts for halide perovskites. The degradation mechanism of halide perovskites with noble metal electrodes is carefully studied and compared with the metalloid electrodes. It is found that the iodide ions can easily halogenate Cu and Ag in halide perovskites. Although Au is almost not halogenated, it can also decompose the perovskite film. On the contrary, after long‐term storage, the metalloid electrodes remain intact on the perovskite film without any degradation. In addition, the long‐time operation stability of the perovskite devices with metalloid electrodes is much higher than that of noble metals. First‐principles calculations confirm the exceptional stability of the metalloid electrodes.This work explores the ultra‐stable electrodes for halide perovskites, paving the way to the large‐scale deployment of perovskite‐based electronic devices.
Subject
General Materials Science,General Chemistry