Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization-Reference-Cited by-同舟云学术

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Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization

Published:2018-05-28 Issue:7 Volume:50 Page:757-765
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf Interface Anal

Author:

Vohánka Jiří¹^ORCID,Ohlídal Ivan¹^ORCID,Ženíšek Jaroslav¹,Vašina Petr¹,Čermák Martin¹,Franta Daniel¹

Affiliation:

1. Department of Physical Electronics, Faculty of Science; Masaryk University; Kotlářská 2 Brno 61137 Czech Republic

Funder

Ministry of Education Youth and Sports of Czech Republic

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference40 articles.

1. Polarimetric methods for the determination of the refractive index and the thickness of thin films on glass;Vašiček;J Opt Soc Am,1947

2. Influence of absorption on measurement of refractive index of films;Heavens;Appl Opt,1965

3. Computational method for determining n and k for a thin film from the measured reflectance, transmittance, and film thickness;Bennett;Appl Opt,1966

4. Ellipsometric method for the determination of all the optical parameters of the system of an isotropic nonabsorbing film on an isotropic absorbing substrate. Optical constants of silicon∗;Vedam;J Opt Soc Am,1969

5. La détermination de l'indice et de l'épaisseur des couches minces transparentes;Abelès;J Phys Radium,1950

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