Double-electron transfer from Xe to Xe4+ at low energies as observed in the trap of a fourier-transform ion cyclotron resonance mass spectrometer
Author:
Publisher
Wiley
Subject
Organic Chemistry,Spectroscopy,Analytical Chemistry
Reference10 articles.
1. State-selective electron capture by Xeq+ ions from rare gas atoms
2. Multiple-electron capture processes by multiply charged ions from rare-gas atoms at low velocities
3. Charge transfer of multiply charged slow argon, krypton and xenon ions on atomic and molecular targets. Single-charge transfer cross sections
4. Total cross sections for different charge changing processes in collisions of highly charged Xe ions with He atoms at low energy
5. Energy gain spectroscopy studies of electron capture by Xeq+(10⩽q⩽20) in collisions with Ne, Ar and Xe
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3. A fourier transform ion cyclotron resonance study of two- and one-electron capture reactions between doubly charged rare gas ions and rare gas atoms;International Journal of Mass Spectrometry;1999-04
4. Ion energy diagnostics in the plume of an SPT-100 from thrust axis to backflow region;34th AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit;1998-07-13
5. The non-neutral plasma: an introduction to physics with relevance to cyclotron resonance mass spectrometry;International Journal of Mass Spectrometry and Ion Processes;1996-12
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