Investigating the chain conformations of spin-coated polymer thin films by ToF-SIMS depth profiling-Reference-Cited by-同舟云学术

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Investigating the chain conformations of spin-coated polymer thin films by ToF-SIMS depth profiling

Published:2015-08-18 Issue:10 Volume:47 Page:953-960
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Ren Xianwen¹,Weng Lu-Tao¹²,Fu Yi¹,Ng Kai-Mo¹³,Chan Chi-Ming¹⁴

Affiliation:

1. Department of Chemical and Biomolecular Engineering; Hong Kong University of Science and Technology; Clear Water Bay Kowloon Hong Kong

2. Materials Characterization and Preparation Facility; Hong Kong University of Science and Technology; Clear Water Bay Kowloon Hong Kong

3. Advanced Engineering Materials Facility; Hong Kong University of Science and Technology; Clear Water Bay Kowloon Hong Kong

4. Division of Environment; Hong Kong University of Science and Technology; Clear Water Bay Kowloon Hong Kong

Funder

Research Grants Council of the Hong Kong Special Administrative Region, China

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference43 articles.

1. 6 Studies of spin-coated polymer films

2. Instabilities during the Formation of Electroactive Polymer Thin Films

3. Influence of surface cleaning on dewetting of thin polystyrene films

4. Suppress polystyrene thin film dewetting by modifying substrate surface with aminopropyltriethoxysilane

5. Stabilization of Nonwetting Thin Liquid Films on a Solid Substrate by Polymeric Additives

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