Chemistry and sputtering induced by fullerene and argon clusters in carbon-based materials-Reference-Cited by-同舟云学术

Chemistry and sputtering induced by fullerene and argon clusters in carbon-based materials

Published:2014-08-08 Issue:S1 Volume:46 Page:11-14
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Czerwinski Bartlomiej¹,Delcorte Arnaud¹

Affiliation:

1. Institute of Condensed Matter and Nanosciences - Bio & Soft Matter (IMCN/BSMA); Université catholique de Louvain; 1 Croix du Sud B-1348 Louvain-la-Neuve Belgium

Funder

Fonds De La Recherche Scientifique - FNRS

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference11 articles.

1. Depth profiling studies of multilayer films with a C60+ ion source

2. The Magic of Cluster SIMS

3. Cluster secondary ion mass spectrometry of polymers and related materials

4. Secondary Ion Mass Spectrometry: Characterizing Complex Samples in Two and Three Dimensions

5. Organic depth profiling of C60and C60/phthalocyanine layers using argon clusters

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Peculiarities of fullerenes and carbon onions application for reinforcing the aluminum matrix in the metal matrix composites;Surface and Interface Analysis;2020-01-28

2. Large cluster ions: soft local probes and tools for organic and bio surfaces;Physical Chemistry Chemical Physics;2020

3. MD-Based Transport and Reaction Model for the Simulation of SIMS Depth Profiles of Molecular Targets;The Journal of Physical Chemistry C;2019-07-24

4. Polymer-matrix nanocomposites bombarded by large Ar clusters and low energy Cs ions: Sputtering and topography development;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2018-05

5. Ejection-ionization of molecules from free standing graphene;The Journal of Chemical Physics;2017-02-28