Method for complex X-ray diffraction analysis of TiN coatings-Reference-Cited by-同舟云学术

Method for complex X-ray diffraction analysis of TiN coatings

Published:1987-10 Issue:10 Volume:22 Page:1301-1311
ISSN:0232-1300
Container-title:Crystal Research and Technology
language:en
Short-container-title:Cryst. Res. Technol.

Author:

Valvoda V.,Černý R.,Kužel R.,Dobiášová L.

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Reference20 articles.

1. : Improved graphical methods for separation of crystallite size and strain in X-ray diffraction analysis, U.K.A.E.A. TRG report 2548, Warrington 1974

2. Determination of Twin Fault Probabilities from the Diffraction Patterns of fcc Metals and Alloys

3. Determination of Molar Ratio in AB1−x Rocksalt-type Compounds by X-ray Powder Diffraction Method. Application to TiC1−x

4. , (a): in: Proceedings Accuracy in powder diffraction, Maryland 1979, NBS publication 1980

5. Determination of crystallite size and lattice distortions through X-ray diffraction line profile analysis

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1. Composite TiN–Ni thin films deposited by reactive magnetron sputter ion-plating;Surface and Coatings Technology;1998-12

2. The structure and properties of Ti-B-N, Ti-Si-B-N, Ti-Si-C-N, and Ti-Al-C-N coatings deposited by magnetron sputtering using composite targets produced by self-propagating high-temperature synthesis (SHS);Journal of Materials Synthesis and Processing;1998

3. Plasma-induced deposition of titanium nitride from TiCl4 in a direct current glow discharge: Control of the chlorine content and gas-phase nucleation;Plasma Chemistry and Plasma Processing;1996-09

4. XRD microstructural study of Zn films deposited by unbalanced magnetron sputtering;Thin Solid Films;1995-07

5. Complex XRD microstructural studies of hard coatings applied to PVD-deposited TiN films Part I. Problems and methods;Thin Solid Films;1994-07