1. Investigation of multiple layer heterojunction structures by means of an electron-beam microprobe-analyzer
2. : Proc. 4th Microprobe Confernce, Dresden (DDR), 1978, p. 112, (ed. Physikalische Gesellschaft der DDR)
3. : X-ray Optics and Microanalysis Orsay, 1965, (eds R. Casting, P. Deschamps, J., Philibert), Paris 1966, p. 310
4. : in: Practical Scanning Electron Microscopy (eds. J. I. Goldstein, H. Yakowitz), New York and London 1975. a) p. 81; b) p. 40
5. Effects of composition profile on characteristics of GaAs–Ga1−xAlxAs double‐heterostructure lasers