Summary of ISO/TC201 standard: ISO/TR 18394:2006—surface chemical analysis—Auger electron spectroscopy—derivation of chemical information-Reference-Cited by-同舟云学术

Summary of ISO/TC201 standard: ISO/TR 18394:2006—surface chemical analysis—Auger electron spectroscopy—derivation of chemical information

Published:2007 Issue:6 Volume:39 Page:556-558
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Kövér L.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference15 articles.

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3. Handbooks of Monochromatic XPS Spectra, Three-Volume Set, No. 3. John Wiley and Sons: 2000.

4. , , , , . X-ray Photoelectron Spectroscopy Database, Version 3.4, Standard Reference Database 2.0. National Institute of Standards and Technology: Gaithersburg, MD, 2003; Accessible at http://srdata.nist.gov./xps; Surface Analysis Society of Japan, home page: http://www.sasj.gr.jp.

5. . An Introduction to Surface Analysis by XPS and AES. John Wiley and Sons: Chichester, 2003.

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1. Development of standards for reliable surface analyses by ISO technical committee 201 on surface chemical analysis;Surface and Interface Analysis;2014-10-07

2. Surface and Interface Characterization;Springer Handbook of Metrology and Testing;2011

3. Summary of ISO/TC 201 Standard: ISO 29081: 2010, surface chemical analysis-Auger electron spectroscopy-reporting of methods used for charge control and charge correction;Surface and Interface Analysis;2010-12-29