Enhanced Fröhlich interaction of semiconductor cuprous oxide films determined by temperature-dependent Raman scattering and spectral transmittance
Author:
Affiliation:
1. Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronic Engineering; East China Normal University; Shanghai 200241 China
Publisher
Wiley
Subject
Spectroscopy,General Materials Science
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/jrs.4145/fullpdf
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1. Smooth and conductive DNA-templated Cu2O nanowires: growth morphology, spectroscopic and electrical characterization
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