New approaches to failure analysis using XPS sputter-depth profiles-Reference-Cited by-同舟云学术

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New approaches to failure analysis using XPS sputter-depth profiles

Published:1988-04 Issue:6-7 Volume:11 Page:359-365
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Davis G. D.,Clearfield H. M.,Moshier W. C.,Cote G. O.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference11 articles.

1. in Practical Surface Analysis, ed. by and p. 141, John Wiley, Chichester (1984).

2. and in Practical Surface Analysis, ed. by and p. 217, John Wiley, Chichester (1984).

3. American Society for Testing and Materials standard guide for electron beam effects in Auger electron spectroscopy (E983-84)

4. in Practical Surface Analysis, ed. by and p. 181, John Wiley, Chichester (1984).

5. in Practical Surface Analysis, ed. by and p. 477, John Wiley, Chichester (1984).

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. LATEX ACRYLIC SEALANTS;Handbook of Aluminum Bonding Technology and Data;1993-06-16

2. Surface treatment of aluminum and titanium: From basic research to production failure analysis;Surface and Interface Analysis;1991-06-16

3. X-Ray Photoelectron Spectroscopy Sputter Depth Profile Analysis of Spatially Controlled Microstructures in Conductive Polymer Films;Analytical Chemistry;1991-01-01

4. Characterization of Surfaces;Adhesive Bonding;1991

5. Ion-selective electrodes;Analytical Chemistry;1990-06-15

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