Author:
Carlson Brad A.,Phillips Bradway F.
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference7 articles.
1. Secondary ion mass spectroscopy analysis of moisture penetration of dielectric films
2. NBS Special Publication 400-23, ARAP/NBS Workshop IV, pp. 65-72. National Bureau of Standards (1975).
3. Secondary‐ion mass spectrometry (SIMS) analysis of electron‐bombarded soda‐lime‐silica glass
4. and in Secondary Ion Mass Spectrometry, Chapt. 4, pp. 2-1 - 4.2-5. Wiley-Interscience, New York (1989).
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