The status of reference data, reference materials and reference procedures in surface analysis-Reference-Cited by-同舟云学术

The status of reference data, reference materials and reference procedures in surface analysis

Published:1988-10 Issue:1 Volume:13 Page:46-50
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Grant J. T.,Williams P.,Fine J.,Powell C. J.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference13 articles.

1. The development of standards for surface analysis

2. ASTM Standard Guide for Specimen Handling in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy (E1078-85), Surf. Interface Anal. 11, 119 (1988).

3. ASTM standards in surface analysis are published in Vol. 3.06 of the Annual Book of ASTM Standards (American Society for Testing and Materials, Philadelphia). These standards have been republished in a separate compilation, available from ASTM and in Surface and Interface Analysis.

4. Data compilations: their use to improve measurement certainty in surface analysis by aes and xps

5. J. Phys. Chem. Ref. Data (to be published).

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Quantitative analysis of Si1-xGex alloy films by SIMS and XPS depth profiling using a reference material;Applied Surface Science;2018-02

2. Roles of chemical metrology in electronics industry and associated environment in Korea: A tutorial;Talanta;2015-03

3. Tutorial: Current Status of Standardization for Practical Surface Analysis Methods and Activities of KRISS;Journal of Surface Analysis;2015

4. Quantitative analysis of Cu(In,Ga)Se2thin films by secondary ion mass spectrometry using a total number counting method;Metrologia;2012-06-13

5. Inter-laboratory comparison: Quantitative surface analysis of thin Fe-Ni alloy films;Surface and Interface Analysis;2011-05-27