Quantification of surface roughness effect on elastically backscattered electrons-Reference-Cited by-同舟云学术

Quantification of surface roughness effect on elastically backscattered electrons

Published:2014-05-15 Issue:7 Volume:46 Page:489-496
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Ding X.¹,Da B.¹,Gong J. B.¹,Mao S. F.²,Li H. M.³,Ding Z. J.⁴

Affiliation:

1. School of Physics; University of Science and Technology of China; Hefei Anhui 230026 China

2. School of Nuclear Science and Technology; University of Science and Technology of China; Hefei Anhui 230026 China

3. Supercomputing Center; University of Science and Technology of China; Hefei Anhui 230026 China

4. Hefei National Laboratory for Physical Sciences at Microscale and Department of Physics; University of Science and Technology of China; Hefei Anhui 230026 China

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference45 articles.

1. Elastic backscattering of electrons: determination of physical parameters of electron transport processes by elastic peak electron spectroscopy

2. Evaluation of Calculated and Measured Electron Inelastic Mean Free Paths Near Solid Surfaces

3. Estimation of surface excitation correction factor for 200-5000 eV in Ni from absolute elastic scattering electron spectroscopy

4. Evaluation of theoretical models for elastic electron backscattering from surfaces

5. Electron inelastic mean free paths: influence of the modelling energy-loss function

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