Determination of Charge-Transport Parameters for Metals with Cubic Symmetry by a Study of Size Effects in Thin Films-Reference-Cited by-同舟云学术

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Determination of Charge-Transport Parameters for Metals with Cubic Symmetry by a Study of Size Effects in Thin Films

Published:1973-07-01 Issue:1 Volume:58 Page:K5-K7
ISSN:0370-1972
Container-title:Physica Status Solidi (b)
language:de
Short-container-title:Phys. Stat. Sol. (b)

Author:

Reale C.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. Thin Film Phenomena, McGraw-Hill Publ. Co., New York 1969 (p. 350).

2. The electrical conductivity of thin metal films with very smooth surfaces

3. Dependence of the electron surface scattering on the crystal orientation in epitaxially grown films

4. Resistivity Studies of Single-Crystal and Polycrystal Films of Aluminum

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-ray detectors with Ta/Al/AlxOy/Al hetero tunnel junctions;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1996-02

2. Growth and characterization of epitaxial vanadium films;Thin Solid Films;1994-08

3. High resolution X-ray spectroscopy with superconducting tunnel junctions;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1993-03

4. Electrical resistivity of polycrystalline vanadium films;Journal of Materials Science;1988-03

5. Some transport properties of transition metal films;Journal of Materials Science;1985-03

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