Surface and buried interface layer studies on challenging structures as studied by ARXPS-Reference-Cited by-同舟云学术

Surface and buried interface layer studies on challenging structures as studied by ARXPS

Published:2017-07-28 Issue:13 Volume:49 Page:1309-1315
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Sodhi Rana N. S.¹^ORCID,Brodersen Peter¹,Cademartiri Ludovico²,Thuo Martin M.²,Nijhuis Christian A.³

Affiliation:

1. Ontario Centre for the Characterisation of Advanced Materials (OCCAM), Department of Chemical Engineering and Applied Chemistry University of Toronto Toronto ON Canada M5S 3E5

2. Department of Materials Science and Engineering Iowa State University Ames IA 50011 USA

3. Department of Chemistry and Centre for Advanced 2D Materials (CA2DM) National University of Singapore 6 Science Drive 2 Singapore 117546

Funder

Air Force Office of Scientific Research

University of Toronto

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/sia.6270

Reference27 articles.

1. An x‐ray photoelectron spectroscopy study on ozone treated InP surfaces

2. Thermal desorption of oxides on InP

3. An x‐ray photoelectron spectroscopy study of Fermi level position and surface composition during formation and removal of oxides on InP

4. Characterization of surface oxides and oxide desorption on InGaAs

5. Studies of the UV/Ozone oxidation of GaAs using angle-resolved x-ray photoelectron spectroscopy

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