Evaluation of structural, electronic, thermoelectric, and optical results of C‐doped HfO 2 by first‐principle's investigation-Reference-Cited by-同舟云学术

Evaluation of structural, electronic, thermoelectric, and optical results of C‐doped HfO 2 by first‐principle's investigation

Published:2019-10-14 Issue:1 Volume:44 Page:144-157
ISSN:0363-907X
Container-title:International Journal of Energy Research
language:en
Short-container-title:Int J Energy Res

Author:

Cao Zhenheng¹²,Fan Ting³,Hou Xueyuan¹²,Niu Jiajia⁴,Sharma Ramesh⁵,Dar Sajad Ahmad⁶^ORCID

Affiliation:

1. School of Chemistry and Chemical EngineeringYan'an University Yan'an 716000 PR China

2. Shaanxi Key Laboratory of Chemical Reaction Engineering Yan'an City 716000 PR China

3. School of New Energy and Environmental EngineeringJiangxi University of Engineering Xinyu City 330046 PR China

4. School of Chemistry and Chemical EngineeringYan'an University Yan'an City 716000 PR China

5. Department of Applied ScienceFeroze Gandhi Institute of Engineering and Technology Raebareli 229001 (U.P.) India

6. Department of PhysicsGovt. Motilal Vigyan Mahavidyalya College Bhopal 462008 Madhya Pradesh State India

Publisher

Wiley

Subject

Energy Engineering and Power Technology,Fuel Technology,Nuclear Energy and Engineering,Renewable Energy, Sustainability and the Environment

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/er.4878

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5. KarS. “High Permittivity Gate Dielectric Materials” SpringerVerlag Berlin Heidelberg 2013. 10‐ K. Takahashi M. Nakayama S. Yokoyama T. Kimura E. Tokumitsu and H. Funakubo Applied Surface Science 216 296 (2003).

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