Design of Promising Uranyl(VI) Complexes Thin Films with Potential Applications in Molecular Electronics

Author:

Monzón González César Raúl1,Sánchez Vergara María Elena2,Elías‐Espinosa Milton Carlos34,Rodríguez‐Valencia Sergio Arturo5,López‐Mayorga Byron José6,Castillo‐Arroyave José León6,Toscano Rubén Alfredo1,Flores Octavio Lozada7,Álvarez Toledano Cecilio1

Affiliation:

1. Instituto de Química Universidad Nacional Autónoma de México Circuito Exterior s/n. C.U. Delegación Coyoacán, C.P. 04510 Ciudad de México México

2. Facultad de Ingeniería Universidad Anáhuac México Avenida Universidad Anáhuac 46, Col. Lomas Anáhuac Huixquilucan Estado de México 52786 México

3. Tecnológico de Monterrey Escuela de Ingeniería y Ciencias Av. Carlos Lazo 100 Santa Fe, La Loma Ciudad de México México 01389

4. Tecnológico de Monterrey Escuela de Ingeniería y Ciencias Calle del Puente Ejidos de Huipulco, Tlalpan Ciudad de México México 14380

5. Tecnológico de Monterrey Escuela de Ingeniería y Ciencias Carr. Lago de Guadalupe Km. 3.5, Col. Margarita Maza de Juárez Atizapán de Zaragoza Estado de México México 52926

6. Escuela de Química Facultad de Ciencias Químicas y Farmacia Universidad de San Carlos de Guatemala 11 avenida Ciudad de Guatemala Guatemala 01012

7. Facultad de Ingeniería Universidad Panamericana Augusto Rodin 498 Ciudad de México 03920 México

Abstract

AbstractIn this work, it is proposed the development of organic semiconductors (OS) based on uranyl(VI) complexes. The above by means of the synthesis and the characterization of the complexes by Infrared spectroscopy, Nuclear magnetic resonance spectroscopy, mass spectrometry, and X‐ray diffraction. Films of these complexes were deposited and subsequently, topographic and structural characterization was carried out by Scanning Electron Microscopy, X‐ray diffraction, and Atomic Force Microscopy. Additionally, the nanomechanical evaluation was performed to know the stiffness of uranyl films using their modulus of elasticity. Also, the optical characterization took place in the devices and their bandgap value ranges between 2.40 and 2.93 eV being the minor for the film of the uranyl complex with the N on pyridine in position 4 (2 c). Finally, the electrical behavior of the uranyl(VI) films was evaluated, and important differences were obtained: the uranyl complex with the N on pyridine in position 2 (2 a) film is not influenced by changes in lighting and its current density is in the order of 10−3 A/cm2. The film with uranyl complex with the N on pyridine in position 3 (2 b) and 2 c presents a greater current flow under lighting conditions and two orders of magnitude larger than in film 2 a. In these films 2 b and 2 c, ohmic behavior occurs at low voltages, while at high voltages the charge transport changes to space‐charge limited current behavior.

Funder

Universidad Nacional Autónoma de México

Publisher

Wiley

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