Study of the Interface Layers Between Si Nanoparticles and SiO2 Matrix Deposited by e-Gun Evaporation-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Study of the Interface Layers Between Si Nanoparticles and SiO2 Matrix Deposited by e-Gun Evaporation

Published:2018-03-24 Issue:10 Volume:255 Page:1700633
ISSN:0370-1972
Container-title:physica status solidi (b)
language:en
Short-container-title:Phys. Status Solidi B

Author:

Pivac Branko¹^ORCID,Dubček Pavo¹,Dasović Jasna¹,Zorc Hrvoje¹,Bernstorff Sigrid²

Affiliation:

1. RuđerBošković Institute; Bijenička 54 10000 Zagreb Croatia

2. Elettra-Sincrotrone Trieste; SS 14, km 163.5; Basovizza (TS) Italy

Funder

Croatian Science Foundation

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssb.201700633/fullpdf

Reference34 articles.

1. Quantum dot solar cells

2. Silicon nanostructures for third generation photovoltaic solar cells

3. Optical properties of Si-rich SiO2 films in relation with embedded Si mesoscopic particles

4. Visible light emission from Si nanocrystalline composites via reactive evaporation of SiO

5. GISAXS study of Si nanocrystals formation in SiO2 thin films

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Stress Evolution during Ge Nanoparticles Growth in a SiO2 Matrix;Inorganic Chemistry;2018-11-14

2. Self-Ordered Voids Formation in SiO2 Matrix by Ge Outdiffusion;Journal of Nanomaterials;2018

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP