Substrate‐independent analysis of microcrystalline silicon thin films using UV Raman spectroscopy-Reference-Cited by-同舟云学术

Substrate‐independent analysis of microcrystalline silicon thin films using UV Raman spectroscopy

Published:2017-05-26 Issue:9 Volume:254 Page:1700204
ISSN:0370-1972
Container-title:physica status solidi (b)
language:en
Short-container-title:Phys. Status Solidi B

Author:

Carpenter Joe V.¹,Bailly Mark²,Boley Allison³,Shi Jianwei²,Minjares Michael²,Smith David J.³,Bowden Stuart²,Holman Zachary C.²

Affiliation:

1. Materials Science and EngineeringArizona State UniversityTempeAZ 85287USA

2. Electrical EngineeringArizona State UniversityTempeAZ 85287USA

3. Department of PhysicsArizona State UniversityTempeAZ 85287USA

Funder

National Science Foundation

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssb.201700204

Reference25 articles.

1. High-efficiency Silicon Heterojunction Solar Cells: A Review

2. D.Kotekar‐Patil S.Jauerneck D.Wharam andD.Kern Discrete Charging in Polysilicon Gates of Single Electron Transistors in: 13th International Conference on Ultimate Integration on Silicon Grenoble France 2012.

3. Strategies for Doped Nanocrystalline Silicon Integration in Silicon Heterojunction Solar Cells

4. Abruptness of a-Si:H∕c-Si interface revealed by carrier lifetime measurements

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