Resonance-enhanced multiphoton ionization/secondary neutral mass spectrometry and cesium attachment secondary ion mass spectrometry of bronze: a comparison-Reference-Cited by-同舟云学术

Resonance-enhanced multiphoton ionization/secondary neutral mass spectrometry and cesium attachment secondary ion mass spectrometry of bronze: a comparison

Published:2002 Issue:5 Volume:33 Page:394-400
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

McCann M. P.,Calaway W. F.,Pellin M. J.,Veryovkin I. V.,Constantinides I.,Adriaens A.,Adams F.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference23 articles.

1. PhD thesis, Universiteit Antwerpen, Antwerpen, Belgium, 2001.

2. Quantitative Analysis Using Secondary Ion Mass Spectrometry.

3. The effect of oxygen adsorption on CuNi alloys during irradiation studied by SIMS, SIPS and ISS

4. Matrix effect in SIMS analysis using an O2+ primary beam

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