Scanning deep level transient spectroscopy (SDLTS)
Author:
Publisher
Wiley
Subject
Instrumentation,Atomic and Molecular Physics, and Optics
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/sca.4950070602/fullpdf
Reference21 articles.
1. Current transient spectroscopy: A high-sensitivity DLTS system;Borsuk;IEEE Trans Electron Devices,1980
2. A capacitance meter of high absolute sensitivity suitable for scanning DLTS application;Breitenstein;Phys Stat Sol a,1982
3. Breitenstein O 1984
4. Combined electron microscopical and DLTS (esp. SDLTS) investigations in semiconductors;Breitenstein;J Phys Colloq,1983
5. Scanning-DLTS investigation of the EL 2 level in plastically deformed GaAs;Breitenstein;Phys Stat Sol a,1983
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