Low-energy electron/atom elastic scattering cross sections from 0.1-30 keV-Reference-Cited by-同舟云学术

Low-energy electron/atom elastic scattering cross sections from 0.1-30 keV

Published:2006-12-07 Issue:4 Volume:17 Page:250-253
ISSN:0161-0457
Container-title:Scanning
language:en
Short-container-title:Scanning

Author:

Browning R.,Li T. Z.,Chui B.,Ye Jun,Pease R. F. W.,Czyzewski Z.,Joy D. C.

Publisher

Wiley

Subject

Instrumentation,Atomic and Molecular Physics, and Optics

Reference11 articles.

1. Electron-specimen interactions in low-voltage scanning electron microscopy;Böngler;Scanning,1993

2. Browning R Li TZ Chui B Ye J Pease RFW Czyewski Z Joy DC Empirical forms for the electron/atom elastic scattering cross sections from 0.1 to 30 keV J Appl Phys 2016 2022 1994

3. Calculations of Mott scattering cross section;Czyzewski;J Appl Phys,1990

4. Rückstreukoeffient und Sekundärelektron-Ausbeute von 10-100 keV Elektronen und Beziehungen zur Raster-Elektronenmikroskopie;Dresher;Z angew Phys,1970

5. A data base on electron-solid interactions;Joy;Scanning,1995

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