Fundamental problems of imaging subsurface structures in the backscattered electron mode in scanning electron microscopy-Reference-Cited by-同舟云学术

Fundamental problems of imaging subsurface structures in the backscattered electron mode in scanning electron microscopy

Published:2006-12-07 Issue:4 Volume:23 Page:235-240
ISSN:0161-0457
Container-title:Scanning
language:en
Short-container-title:Scanning

Author:

Rau E. I.,Reimer L.

Publisher

Wiley

Subject

Instrumentation,Atomic and Molecular Physics, and Optics

Reference14 articles.

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4. Goldstein JI Costley J Lorimer G Quantitative x-ray analysis in the electron microscope Scan Electron Microsc 315 324 1977

5. Electron backscattering from solids and double layers;Iafrate;J Vac Sci Technol,1976

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