A Van Der Waals Reconfigurable Multi‐Valued Logic Device and Circuit Based on Tunable Negative‐Differential‐Resistance Phenomenon-Reference-Cited by-同舟云学术

A Van Der Waals Reconfigurable Multi‐Valued Logic Device and Circuit Based on Tunable Negative‐Differential‐Resistance Phenomenon

Published:2022-08-07 Issue:36 Volume:34 Page:2202799
ISSN:0935-9648
Container-title:Advanced Materials
language:en
Short-container-title:Advanced Materials

Author:

Seo Seunghwan¹,Cho Jeong‐Ick¹,Jung Kil‐Su²³,Andreev Maksim¹,Lee Ju‐Hee¹,Ahn Hogeun¹,Jung Sooyoung¹⁴,Lee Taeran¹,Kim Byeongchan¹,Lee Seojoo¹,Kang Juncheol¹,Lee Kyeong‐Bae¹,Lee Ho‐Jun¹,Kim Ki Seok⁵⁶,Yeom Geun Young⁶,Heo Keun⁷,Park Jin‐Hong¹⁷^ORCID

Affiliation:

1. Department of Electrical and Computer Engineering Sungkyunkwan University (SKKU) Suwon 16419 Korea

2. Department of Semiconductor and Display Engineering Sungkyunkwan University Suwon 16417 Korea

3. Memory Technology Design Team Samsung Electronics Co. Ltd Hwasung 18448 Korea

4. Research Laboratory of Electronics Massachusetts Institute of Technology (MIT) Cambridge MA 02139 USA

5. School of Advanced Materials Science and Engineering Sungkyunkwan University Suwon 16417 Korea

6. School of Semiconductor Science & Technology Jeonbuk National University Jeonju 54896 Korea

7. Sungkyunkwan Advanced Institute of Nanotechnology (SAINT) Sungkyunkwan University Suwon 16417 Korea

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/adma.202202799

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