Affiliation:
1. Department of Radiology Northwestern University Chicago Illinois USA
2. Department of Radiology Yale New Haven Health New Haven Connecticut USA
3. Department of Radiology University of Washington Seattle Washington USA
4. Department of Radiology Hartford Health Hartford Connecticut USA
Abstract
AbstractBackgroundMeasurement of Computed Tomography (CT) beam width is required by accrediting and regulating bodies for routine physics evaluations due to its direct correlation to patient dose. Current methods for performing CT beam width measurement require special hardware, software, and/or consumable films. Today, most 100‐mm pencil chambers with a digital interface used to evaluate Computed Tomography Dose Index (CTDIvol) have a sufficiently high sampling rate to reconstruct a high‐resolution dose profile for any acquisition mode.PurposeThe goal of this study is to measure the CT beam width from the sampled dose profile under a single helical acquisition with the 100‐mm pencil chamber used for CTDIvol measurements.MethodsThe dose profiles for different scanners were measured for helical scans with varying collimation settings using a 100‐mm pencil chamber placed at the isocenter and co‐moving with the patient table. The measured dose profiles from the 100‐mm pencil chamber were corrected for table attenuation by extracting a periodic correction function (PCF) to eliminate table interference. The corrected dose profiles were then deconvolved with the response function of the chamber to compute the beam profile. The beam width was defined by the full width half maximum (FWHM) of the resulting beam profile. Reference dose profiles were also measured using Gafchromic film for comparison.ResultsThe beam widths, estimated using the innovative deconvolution method from the 100‐mm pencil chamber, exhibit an average percentage difference of 1.6 ± 1.8 when compared with measurements obtained through Gafchromic film for beam width assessment.ConclusionThe proposed approach to deconvolve the pencil chamber response demonstrates the potential of obtaining the CT beam width at high accuracy without the need of special hardware, software, or consumable films. This technique can improve workflow for routine performance evaluation of CT systems.
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