The long-term stability ofn-AlGaAs/InGaAs/GaAs pseudomorphic HEMTs

Author:

Saunders N. L.,Rezazadeh A. A.,Morgan D. V.,Thomas H.,Hipwood L. G.

Publisher

Wiley

Subject

Management Science and Operations Research,Safety, Risk, Reliability and Quality

Reference25 articles.

1. ‘Microwave Field-Effect Transistors: Theory, Design, and Applications’, Research Studies Press, Wiley, 1986.

2. , , , , , , , and , ‘Monolithic V-Band pseudomorphic MODFET low noise amplifiers’, MTT-S International Microwave Symposium, 1989, pp. 199–204.

3. and , ‘HEMT based MMIC amplifier for enhanced EW system performance’, Microwave Journal, February 1988, pp. 167–174.

4. , , , , , , and ‘Reliability of discrete MODFETs: life testing radiation effects, and ESD’, International Reliability Physics Symposium Proceedings, 1988, pp. 96–101.

5. Stability of strained quantum-well field-effect transistor structures

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