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The physical basis for the roller-coaster hazard rate curve for electronics

  • Published:1991-11 Issue:6 Volume:7 Page:489-495
  • ISSN:0748-8017
  • Container-title:Quality and Reliability Engineering International
  • language:en
  • Short-container-title:Qual. Reliab. Engng. Int.

Author:

Wong Kam L.

Publisher

Wiley

Subject

Management Science and Operations Research,Safety, Risk, Reliability and Quality

Reference10 articles.

1. and , ‘Off the bathtub onto the roller-coaster curve’, Proceedings of the Annual Reliability and Maintainability Symposium, 1988.

2. and , ‘The reliability of semiconductor devices in the Bell system’, Proceedings of the IEEE, 1974.

3. ‘Deterministic failure prediction’, Proceedings of the Annual Reliability and Maintainability Symposium, 1987.

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