Analysis of diffusion mechanisms in thin polycrystalline Au-Ag films using auger electron spectroscopy-Reference-Cited by-同舟云学术

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Analysis of diffusion mechanisms in thin polycrystalline Au-Ag films using auger electron spectroscopy

Published:1983-02 Issue:1 Volume:5 Page:20-27
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Bukaluk Antoni

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference26 articles.

1. and in Thin Films: Interdiffusion and Reactions, ed. by and p. 161-242. Wiley, New York (1978).

2. and in Thin Films: Interdiffusion and Reactions, ed. by and p. 161-242. Wiley, New York (1978).

3. Diffusion processes in thin films

4. The Scattering of Electromagnetic Waves from Rough Surfaces, part I, Macmillan, New York (1963).

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